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1 Ergebnisse
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Validating S‐parameter measurements of RF integrated circui..:
M. Stanley
;
R. Parker‐Jervis
;
S. deGraaf
...
https://doi.org/10.1049/ell2.12545. , 2022
Link:
https://doi.org/10.1049/ell2.12545
RT Journal T1
Validating S‐parameter measurements of RF integrated circuits at milli‐Kelvin temperatures
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:f519c0ef53ae4659a162dd5d589a677e&Exemplar=1&LAN=DE A1 M. Stanley A1 R. Parker‐Jervis A1 S. deGraaf A1 T. Lindström A1 J. E. Cunningham A1 N. M. Ridler PB Wiley YR 2022 K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 JF https://doi.org/10.1049/ell2.12545 LK http://dx.doi.org/https://doi.org/10.1049/ell2.12545 DO https://doi.org/10.1049/ell2.12545 SF ELIB - SuUB Bremen
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