I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Imaging Conductive Objects Through Metal Enclosures Using E..:
Ho Y. Kim
;
Vijay Harid
;
Alexander Mroz
...
https://ieeexplore.ieee.org/document/9078807/. , 2020
Link:
https://doi.org/10.1109/ACCESS.2020.2990403
RT Journal T1
Imaging Conductive Objects Through Metal Enclosures Using ELF/VLF Magnetic Fields
UL https://suche.suub.uni-bremen.de/peid=base-ftdoajarticles:oai:doaj.org_article:ff1744dc9f1a47e195ef4010569d1dc3&Exemplar=1&LAN=DE A1 Ho Y. Kim A1 Vijay Harid A1 Alexander Mroz A1 Joshua Wewerka A1 Dalibor J. Todorovski A1 Mark Golkowski A1 Ronald A. L. Rorrer A1 Morris B. Cohen A1 Nathan M. Opalinski PB IEEE YR 2020 K1 Computational electromagnetics K1 extremely low frequency K1 near-field K1 nondestructive evaluation K1 surface integral equation K1 through conductor imaging K1 Electrical engineering. Electronics. Nuclear engineering K1 TK1-9971 JF https://ieeexplore.ieee.org/document/9078807/ LK http://dx.doi.org/https://doi.org/10.1109/ACCESS.2020.2990403 DO https://doi.org/10.1109/ACCESS.2020.2990403 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)