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1 Ergebnisse
1
Enhancement Mode GaN-FETs in Extreme Temperature Conditions..:
Duraij, Martijn S
;
Xiao, Yudi
;
Zsurzsan, Gabriel
.
https://orbit.dtu.dk/en/publications/9c55db35-0db2-4e91-ac9a-40e920e49a28. , 2021
Link:
https://orbit.dtu.dk/en/publications/9c55db35-0db2-4e9..
RT Journal T1
Enhancement Mode GaN-FETs in Extreme Temperature Conditions, Part II: Dynamic Parasitic Parameters
UL https://suche.suub.uni-bremen.de/peid=base-ftdtupubl:oai:pure.atira.dk:publications_9c55db35-0db2-4e91-ac9a-40e920e49a28&Exemplar=1&LAN=DE A1 Duraij, Martijn S A1 Xiao, Yudi A1 Zsurzsan, Gabriel A1 Zang, Zhe YR 2021 K1 Device characterization K1 eGaN-FET K1 High temperature K1 Parasitic components K1 Switching losses JF https://orbit.dtu.dk/en/publications/9c55db35-0db2-4e91-ac9a-40e920e49a28 LK http://dx.doi.org/https://orbit.dtu.dk/en/publications/9c55db35-0db2-4e91-ac9a-40e920e49a28 DO https://orbit.dtu.dk/en/publications/9c55db35-0db2-4e91-ac9a-40e920e49a28 SF ELIB - SuUB Bremen
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