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Electron beam probing of silica surface layers on alumina:
Cornet, Nadège
;
Goeuriot, Dominique
;
Touzin, Matthieu
...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.jnoncrysol.2009.03.007. , 2009
Link:
https://hal.science/hal-00849546
RT Journal T1 <Title>Electron beam probing of silica surface layers on alumina</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftecolecentrlyon:oai:HAL:hal-00849546v1&Exemplar=1&LAN=DE A1 Cornet, Nadège A1 Goeuriot, Dominique A1 Touzin, Matthieu A1 Guerret-Piecourt, Christelle A1 Juvé, Denyse A1 Tréheux, Daniel A1 Fitting, Hans-Joachim PB HAL CCSD; Elsevier YR 2009 K1 Electrical and electronic properties K1 Conductivity K1 Dielectric properties K1 Relaxation electric modulus K1 Films and coatings K1 Measurement techniques K1 SEM S100 K1 Microscopy K1 Scanning electron microscopy K1 Modeling and simulation K1 Oxide glasses K1 Silica K1 Thermally stimulated and depolarization current K1 [SPI.MAT]Engineering Sciences [physics]/Materials JF info:eu-repo/semantics/altIdentifier/doi/10.1016/j.jnoncrysol.2009.03.007 LK http://dx.doi.org/https://hal.science/hal-00849546 DO https://hal.science/hal-00849546 SF ELIB - SuUB Bremen
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