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1 Ergebnisse
1
Robustness of SiC MOSFET under avalanche conditions:
Dchar, Ilyas
;
Zolkos, Marion
;
Buttay, Cyril
.
info:eu-repo/semantics/altIdentifier/doi/10.1109/APEC.2017.7931015. , 2017
Link:
https://hal.science/hal-01535735
RT Journal T1 <Title>Robustness of SiC MOSFET under avalanche conditions</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftecolecentrlyon:oai:HAL:hal-01535735v1&Exemplar=1&LAN=DE A1 Dchar, Ilyas A1 Zolkos, Marion A1 Buttay, Cyril A1 Morel, Hervé PB HAL CCSD YR 2017 K1 Parasitic BJT K1 Failure mechanism K1 Critical energy K1 Avalanche breakdown K1 Reliability K1 SiC MOSFET K1 [SPI.TRON]Engineering Sciences [physics]/Electronics JF info:eu-repo/semantics/altIdentifier/doi/10.1109/APEC.2017.7931015 LK http://dx.doi.org/https://hal.science/hal-01535735 DO https://hal.science/hal-01535735 SF ELIB - SuUB Bremen
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