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1 Ergebnisse
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Nano- and micro-scale morghological defects in oxidized a-S..:
Vasin, Andriy
;
Gomeniuk, Yuri
;
Rusavsky, Audrey
...
info:eu-repo/semantics/altIdentifier/doi/10.1002/pssc.201200861. , 2013
Link:
https://hal.science/hal-02544510
RT Journal T1 <Title>Nano- and micro-scale morghological defects in oxidized a-SiC: H thin films</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftensamparis:oai:HAL:hal-02544510v1&Exemplar=1&LAN=DE A1 Vasin, Andriy A1 Gomeniuk, Yuri A1 Rusavsky, Audrey A1 Nazarov, Alexey N A1 Lysenko, V.S A1 Lytvyn, Petro M A1 Gontar, O.G A1 Starik, Sergii P A1 Nouveau, Corinne A1 Ashok, S PB HAL CCSD; Wiley YR 2013 K1 Amorphous SiC films K1 Morphological defects K1 Oxidation K1 [CHIM.MATE]Chemical Sciences/Material chemistry K1 [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci] JF info:eu-repo/semantics/altIdentifier/doi/10.1002/pssc.201200861 LK http://dx.doi.org/https://hal.science/hal-02544510 DO https://hal.science/hal-02544510 SF ELIB - SuUB Bremen
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