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1 Ergebnisse
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ToF-SIMS Li Depth Profiling of Pure and Methylated Amorphou..:
Feng, Yue
;
Koo, Bon Min
;
Seyeux, Antoine
...
info:eu-repo/semantics/altIdentifier/doi/10.1021/acsami.2c08203. , 2022
Link:
https://hal.science/hal-03872818
RT Journal T1 <Title>ToF-SIMS Li Depth Profiling of Pure and Methylated Amorphous Silicon Electrodes After Their Partial Lithiation</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftepunivpsaclay:oai:HAL:hal-03872818v1&Exemplar=1&LAN=DE A1 Feng, Yue A1 Koo, Bon Min A1 Seyeux, Antoine A1 Światowska, Jolanta A1 Henry de Villeneuve, Catherine A1 Rosso, Michel A1 Ozanam, François PB HAL CCSD; Washington, D.C. : American Chemical Society YR 2022 K1 methylated amorphous silicon K1 lithium diffusion K1 ToF-SIMS K1 lithiation front K1 thin-film electrode K1 lithium-ion battery K1 [CHIM.ANAL]Chemical Sciences/Analytical chemistry K1 [CHIM.MATE]Chemical Sciences/Material chemistry JF info:eu-repo/semantics/altIdentifier/doi/10.1021/acsami.2c08203 LK http://dx.doi.org/https://hal.science/hal-03872818 DO https://hal.science/hal-03872818 SF ELIB - SuUB Bremen
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