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Development of in-situ photoluminescence characterization t..:
Sreng, Mengkoing
NNT: 2019IPPAX003. , 2019
Link:
https://theses.hal.science/tel-02496035
RT Journal T1
Development of in-situ photoluminescence characterization tools for the study of semiconductors for photovoltaics application ; Développement des outils de caratérisation in-situ de matériaux semi-conducteur par photoluminescence techniques
UL https://suche.suub.uni-bremen.de/peid=base-ftepunivpsaclay:oai:HAL:tel-02496035v1&Exemplar=1&LAN=DE A1 Sreng, Mengkoing PB HAL CCSD YR 2019 K1 In-Situ photoluminescence K1 Minority carrier lifetime K1 Surface passivation K1 Mono-Junction cell K1 Tandem cell K1 Photoluminescence in-Situ K1 Durée de vie des porteur K1 Passivation de surface K1 Cellule mono-Junction K1 Cellule tandem K1 [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci] K1 [SDE.IE]Environmental Sciences/Environmental Engineering K1 [PHYS.PHYS.PHYS-OPTICS]Physics [physics]/Physics [physics]/Optics [physics.optics] K1 [SPI.NRJ]Engineering Sciences [physics]/Electric power JF NNT: 2019IPPAX003 LK http://dx.doi.org/https://theses.hal.science/tel-02496035 DO https://theses.hal.science/tel-02496035 SF ELIB - SuUB Bremen
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