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1 Ergebnisse
1
Heavy-Ion Microbeam Studies of Single-Event Leakage Current..:
Martinella, Corinna
;
Ziemann, Thomas
;
id_orcid:0 000-0001-5159-4919
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2020.3002729. , 2020
Link:
https://hdl.handle.net/20.500.11850/429961
RT Journal T1
Heavy-Ion Microbeam Studies of Single-Event Leakage Current Mechanism in SiC VD-MOSFETs
UL https://suche.suub.uni-bremen.de/peid=base-ftethz:oai:www.research-collection.ethz.ch:20.500.11850_429961&Exemplar=1&LAN=DE A1 Martinella, Corinna A1 Ziemann, Thomas A1 id_orcid:0 000-0001-5159-4919 A1 Stark, Roger A1 Tsibizov, Alexander A1 Voss, Kay O A1 Alia, Ruben G A1 Kadi, Yacine A1 Grossner, Ulrike A1 id_orcid:0 000-0002-2495-8550 A1 Javanainen, Arto PB IEEE YR 2020 K1 Heavy ion K1 leakage current degradation K1 microbeam K1 silicon carbide (SiC) vertical double-diffused power(VD)-MOSFET K1 single-event effect (SEE) K1 single-event leakage current (SELC) JF info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2020.3002729 LK http://dx.doi.org/https://hdl.handle.net/20.500.11850/429961 DO https://hdl.handle.net/20.500.11850/429961 SF ELIB - SuUB Bremen
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