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1 Ergebnisse
1
Heavy-ion induced single event effects and latent damages i..:
Martinella, Corinna
;
Natzke, Philipp
;
Alía, Rubén G
...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114423. , 2022
Link:
https://hdl.handle.net/20.500.11850/517286
RT Journal T1
Heavy-ion induced single event effects and latent damages in SiC power MOSFETs
UL https://suche.suub.uni-bremen.de/peid=base-ftethz:oai:www.research-collection.ethz.ch:20.500.11850_517286&Exemplar=1&LAN=DE A1 Martinella, Corinna A1 Natzke, Philipp A1 Alía, Rubén G A1 Kadi, Yacine A1 Niskanen, Kimmo A1 Rossi, Mikko A1 Jaatinen, Jukka A1 Kettunen, Heikki A1 Tsibizov, Alexander A1 Grossner, Ulrike A1 id_orcid:0 000-0002-2495-8550 A1 Javanainen, Arto PB Elsevier YR 2022 K1 SiC MOSFETs K1 Heavy-ion K1 Latent damage K1 SEEs JF info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114423 LK http://dx.doi.org/https://hdl.handle.net/20.500.11850/517286 DO https://hdl.handle.net/20.500.11850/517286 SF ELIB - SuUB Bremen
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