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1 Ergebnisse
1
Small-Signal Impedance and Split CV Characterization of Hig..:
Race, Salvatore
;
Kovacevic-Badstuebner, Ivana
;
id_orcid:0 000-0001-6960-2470
...
info:eu-repo/semantics/altIdentifier/doi/10.4028/p-2388hx. , 2023
Link:
https://hdl.handle.net/20.500.11850/642160
RT Journal T1
Small-Signal Impedance and Split CV Characterization of High-k SiC Power MOSFETs
UL https://suche.suub.uni-bremen.de/peid=base-ftethz:oai:www.research-collection.ethz.ch:20.500.11850_642160&Exemplar=1&LAN=DE A1 Race, Salvatore A1 Kovacevic-Badstuebner, Ivana A1 id_orcid:0 000-0001-6960-2470 A1 Stark, Roger A1 Tsibizov, Alexander A1 Belanche Guadas, Manuel A1 id_orcid:0 000-0002-1101-9554 A1 Arango, Yulieth A1 Romano, Gianpaolo A1 Knoll, Lars A1 Grossner, Ulrike A1 id_orcid:0 000-0002-2495-8550 PB Trans Tech Publications YR 2023 K1 SiC MOSFETs K1 High-k dielectrics K1 C-V Characterization K1 Channel-drift resistances K1 Gate impedance JF info:eu-repo/semantics/altIdentifier/doi/10.4028/p-2388hx LK http://dx.doi.org/https://hdl.handle.net/20.500.11850/642160 DO https://hdl.handle.net/20.500.11850/642160 SF ELIB - SuUB Bremen
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