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1 Ergebnisse
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Heavy-Ion-Induced Defects in Degraded SiC Power MOSFETs:
Martinella, Corinna
;
Bathen, Marianne
;
id_orcid:0 000-0002-6269-3530
...
info:eu-repo/semantics/altIdentifier/doi/10.4028/p-3y3lv4. , 2023
Link:
https://hdl.handle.net/20.500.11850/642212
RT Journal T1
Heavy-Ion-Induced Defects in Degraded SiC Power MOSFETs
UL https://suche.suub.uni-bremen.de/peid=base-ftethz:oai:www.research-collection.ethz.ch:20.500.11850_642212&Exemplar=1&LAN=DE A1 Martinella, Corinna A1 Bathen, Marianne A1 id_orcid:0 000-0002-6269-3530 A1 Javanainen, Arto A1 Grossner, Ulrike A1 id_orcid:0 000-0002-2495-8550 PB Trans Tech Publications YR 2023 K1 Single Event Effects K1 Heavy-Ions K1 SiC Power MOSFETs K1 Defects K1 info:eu-repo/classification/ddc/530 K1 Physics JF info:eu-repo/semantics/altIdentifier/doi/10.4028/p-3y3lv4 LK http://dx.doi.org/https://hdl.handle.net/20.500.11850/642212 DO https://hdl.handle.net/20.500.11850/642212 SF ELIB - SuUB Bremen
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