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1 Ergebnisse
1
Investigation of Recovery Phenomena in Hf0.5Zr0.5O2-Based 1..:
Okuno, Jun
;
Yonai, Tsubasa
;
Kunihiro, Takafumi
...
IEEE journal of the Electron Devices Society : J-EDS. , 2023
Link:
https://publica.fraunhofer.de/handle/publica/450831
RT Journal T1
Investigation of Recovery Phenomena in Hf0.5Zr0.5O2-Based 1T1C FeRAM
UL https://suche.suub.uni-bremen.de/peid=base-ftfrauneprints:oai:publica.fraunhofer.de:publica_450831&Exemplar=1&LAN=DE A1 Okuno, Jun A1 Yonai, Tsubasa A1 Kunihiro, Takafumi A1 Shuto, Yusuke A1 Alcala, Ruben A1 Lederer, Maximilian A1 Seidel, Konrad A1 Mikolajick, Thomas A1 Schroeder, Uwe Paul A1 Tsukamoto, Masanori A1 Umebayashi, Taku YR 2023 K1 Capacitor K1 ferroelectric random-access memory K1 hafnium oxide K1 recovery K1 zirconium oxide JF IEEE journal of the Electron Devices Society : J-EDS LK http://dx.doi.org/https://publica.fraunhofer.de/handle/publica/450831 DO https://publica.fraunhofer.de/handle/publica/450831 SF ELIB - SuUB Bremen
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