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1 Ergebnisse
1
Switching operation and degradation of resistive random acc..:
Arita, Masashi
;
Takahashi, Akihito
;
Ohno, Yuuki
...
http://hdl.handle.net/2115/60278. ,
Link:
http://hdl.handle.net/2115/60278
RT Journal T1
Switching operation and degradation of resistive random access memory composed of tungsten oxide and copper investigated using in-situ TEM
UL https://suche.suub.uni-bremen.de/peid=base-fthokunivhus:oai:eprints.lib.hokudai.ac.jp:2115_60278&Exemplar=1&LAN=DE A1 Arita, Masashi A1 Takahashi, Akihito A1 Ohno, Yuuki A1 Nakane, Akitoshi A1 Tsurumaki-Fukuchi, Atsushi A1 Takahashi, Yasuo PB Nature Publishing Group K1 549 JF http://hdl.handle.net/2115/60278 LK http://hdl.handle.net/2115/60278 DO http://hdl.handle.net/2115/60278 SF ELIB - SuUB Bremen
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