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1 Ergebnisse
1
Vulnerability and Hardening Studies of Optical and Illumina..:
Allanche, T
;
Paillet, P
;
Goiffon, V
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2017.2783187. , 2018
Link:
https://hal.science/hal-01684961
RT Journal T1 <Title>Vulnerability and Hardening Studies of Optical and Illumination Systems at MGy Dose Levels</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftiogs:oai:HAL:hal-01684961v1&Exemplar=1&LAN=DE A1 Allanche, T A1 Paillet, P A1 Goiffon, V A1 Muller, C A1 van Uffelen, M A1 Mont-Casellas, L A1 Duhamel, O A1 Marcandella, C A1 Rizzolo, S A1 Magnan, P A1 Clerc, R A1 Lépine, T A1 Hébert, M A1 Boukenter, A A1 Ouerdane, Y A1 Scott, R A1 de Cock, W A1 Girard, S PB HAL CCSD; Institute of Electrical and Electronics Engineers YR 2018 K1 Gamma rays K1 Light-emitting diodes (LEDs) K1 Optical materials K1 Optical systems (OS) K1 Radiation effects K1 [SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processing K1 [SPI.TRON]Engineering Sciences [physics]/Electronics JF info:eu-repo/semantics/altIdentifier/doi/10.1109/TNS.2017.2783187 LK http://dx.doi.org/https://hal.science/hal-01684961 DO https://hal.science/hal-01684961 SF ELIB - SuUB Bremen
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