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1 Ergebnisse
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Structural Characterization of ZnTe Grown by Atomic-Layer-D..:
Castillo-Ojeda, Roberto Saúl
;
Díaz-Reyes, Joel
;
Galván-Arellano, Miguel
...
10.1590/1980-5373-mr-2016-0181. , 2017
Link:
http://www.scielo.br/scielo.php?script=sci_arttext&pid..
RT Journal T1
Structural Characterization of ZnTe Grown by Atomic-Layer-Deposition Regime on GaAs and GaSb (100) Oriented Substrates
UL https://suche.suub.uni-bremen.de/peid=base-ftjscielo:oai:scielo:S1516-14392017000501179&Exemplar=1&LAN=DE A1 Castillo-Ojeda, Roberto Saúl A1 Díaz-Reyes, Joel A1 Galván-Arellano, Miguel A1 Anda-Salazar, Francisco de A1 Contreras-Rascon, Jorge Indalecio A1 Peralta-Clara, María de la Cruz A1 Veloz-Rendón, Julieta Salomé PB ABM, ABC, ABPol YR 2017 K1 Atomic Layer Deposition K1 nanolayers K1 X-ray diffraction K1 Raman scattering JF 10.1590/1980-5373-mr-2016-0181 LK http://www.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392017000501179 DO http://www.scielo.br/scielo.php?script=sci_arttext&pid=S1516-14392017000501179 SF ELIB - SuUB Bremen
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