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1 Ergebnisse
1
Direct Ionization Impact on Accelerator Mixed-Field Soft Er..:
Alía, R. G
;
Tali, M
;
Brugger, M
...
IEEE Transactions on Nuclear Science. , 2020
Link:
http://urn.fi/URN:NBN:fi:jyu-202001311914
RT Journal T1
Direct Ionization Impact on Accelerator Mixed-Field Soft Error Rate
UL https://suche.suub.uni-bremen.de/peid=base-ftjyvaeskylaenun:oai:jyx.jyu.fi:123456789_67649&Exemplar=1&LAN=DE A1 Alía, R. G A1 Tali, M A1 Brugger, M A1 Cecchetto, M A1 Cerutti, F A1 Cononetti, A A1 Danzeca, S A1 Esposito, L A1 Fernández-Martínez, P A1 Gilardoni, S A1 Infantino, A A1 Kastriotou, M A1 Kerboub, N A1 Lerner, G A1 Wyrwoll, V A1 Ferlet-Cavrois, V A1 Boatella, C A1 Javanainen, A A1 Kettunen, H A1 Morilla, Y A1 Martín-Holgado, P A1 Gaillard, R A1 Wrobel, F A1 Cazzaniga, C A1 Alexandrescu, D A1 Glorieux, M A1 Puchner, H PB Institute of Electrical and Electronics Engineers YR 2020 K1 säteilyfysiikka K1 ionisoiva säteily K1 mikroelektroniikka JF IEEE Transactions on Nuclear Science LK http://urn.fi/URN:NBN:fi:jyu-202001311914 DO http://urn.fi/URN:NBN:fi:jyu-202001311914 SF ELIB - SuUB Bremen
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