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1 Ergebnisse
1
Validating S-parameter measurements of RF integrated circui..:
Stanley, M
;
Parker‐Jervis, R
;
de Graaf, S
...
https://eprints.whiterose.ac.uk/188168/6/Electronics%20Letters%20-%202022%20-%20Stanley%20-%20Validating%20S%E2%80%90parameter%20measurements%20of%20RF%20integrated%20circuits%20at%20milli%E2%80%90Kelvin%20%281%29.pdf. , 2022
Link:
https://eprints.whiterose.ac.uk/188168/
RT Journal T1 <Title>Validating S-parameter measurements of RF integrated circuits at milli-Kelvin temperatures</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftleedsuniv:oai:eprints.whiterose.ac.uk:188168&Exemplar=1&LAN=DE A1 Stanley, M A1 Parker‐Jervis, R A1 de Graaf, S A1 Lindström, T A1 Cunningham, JE A1 Ridler, NM PB Wiley Open Access YR 2022 JF https://eprints.whiterose.ac.uk/188168/6/Electronics%20Letters%20-%202022%20-%20Stanley%20-%20Validating%20S%E2%80%90parameter%20measurements%20of%20RF%20integrated%20circuits%20at%20milli%E2%80%90Kelvin%20%281%29.pdf LK http://dx.doi.org/https://eprints.whiterose.ac.uk/188168/ DO https://eprints.whiterose.ac.uk/188168/ SF ELIB - SuUB Bremen
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