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1 Ergebnisse
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LDAVPM: A Latch Design and Algorithm-based Verification Pro..:
Yan, Aibin
;
Li, Zhixing
;
Cui, Jie
...
info:eu-repo/semantics/altIdentifier/doi/10.1109/TCAD.2022.3213212. , 2023
Link:
https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770056
RT Journal T1 <Title>LDAVPM: A Latch Design and Algorithm-based Verification Protected against Multiple-Node-Upsets in Harsh Radiation Environments</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftlirmm:oai:HAL:lirmm-03770056v1&Exemplar=1&LAN=DE A1 Yan, Aibin A1 Li, Zhixing A1 Cui, Jie A1 Huang, Zhengfeng A1 Ni, Tianming A1 Girard, Patrick A1 Wen, Xiaoqing PB HAL CCSD; IEEE YR 2023 K1 Latch design K1 Algorithm-based verification K1 Fault tolerance K1 Muller C-element K1 Multiple-node-upset K1 [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics JF info:eu-repo/semantics/altIdentifier/doi/10.1109/TCAD.2022.3213212 LK http://dx.doi.org/https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770056 DO https://hal-lirmm.ccsd.cnrs.fr/lirmm-03770056 SF ELIB - SuUB Bremen
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