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1 Ergebnisse
1
Statistical Analysis of the Random Telegraph Noise in a 1.1..:
Calvin Chao
;
Honyih Tu
;
Thomas Wu
...
https://dx.doi.org/10.3390/s17122704. , 2017
Link:
https://doi.org/10.3390/s17122704
RT Journal T1
Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method
UL https://suche.suub.uni-bremen.de/peid=base-ftmdpi:oai:mdpi.com:_1424-8220_17_12_2704_&Exemplar=1&LAN=DE A1 Calvin Chao A1 Honyih Tu A1 Thomas Wu A1 Kuo-Yu Chou A1 Shang-Fu Yeh A1 Chin Yin A1 Chih-Lin Lee PB Multidisciplinary Digital Publishing Institute YR 2017 K1 CMOS image sensor (CIS) K1 random telegraph noise (RTN) K1 correlated double sampling (CDS) K1 RTN emission and capture time constant K1 backside-illuminated technology (BSI) K1 pinned photodiode (PPD) K1 Gumbel distribution JF https://dx.doi.org/10.3390/s17122704 LK http://dx.doi.org/https://doi.org/10.3390/s17122704 DO https://doi.org/10.3390/s17122704 SF ELIB - SuUB Bremen
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