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Structural and Optical Characterization of ZnS Ultrathin Fi..:
Maksymilian Włodarski
;
Urszula Chodorow
;
Stanisław Jóźwiak
...
Thin Films and Interfaces. , 2019
Link:
https://doi.org/10.3390/ma12193212
RT Journal T1
Structural and Optical Characterization of ZnS Ultrathin Films Prepared by Low-Temperature ALD from Diethylzinc and 1.5-Pentanedithiol after Various Annealing Treatments
UL https://suche.suub.uni-bremen.de/peid=base-ftmdpi:oai:mdpi.com:_1996-1944_12_19_3212_&Exemplar=1&LAN=DE A1 Maksymilian Włodarski A1 Urszula Chodorow A1 Stanisław Jóźwiak A1 Matti Putkonen A1 Tomasz Durejko A1 Timo Sajavaara A1 Małgorzata Norek PB Multidisciplinary Digital Publishing Institute YR 2019 K1 atomic layer deposition (ALD) K1 ZnS thin films K1 annealing K1 optical properties JF Thin Films and Interfaces LK http://dx.doi.org/https://doi.org/10.3390/ma12193212 DO https://doi.org/10.3390/ma12193212 SF ELIB - SuUB Bremen
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