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X-Ray Photoelectron Spectroscopy Depth Profiling of As-Grow..:
Monzer Maarouf
;
Muhammad Baseer Haider
;
Qasem Ahmed Drmosh
.
Crystal Engineering. , 2021
Link:
https://doi.org/10.3390/cryst11030239
RT Journal T1
X-Ray Photoelectron Spectroscopy Depth Profiling of As-Grown and Annealed Titanium Nitride Thin Films
UL https://suche.suub.uni-bremen.de/peid=base-ftmdpi:oai:mdpi.com:_2073-4352_11_3_239_&Exemplar=1&LAN=DE A1 Monzer Maarouf A1 Muhammad Baseer Haider A1 Qasem Ahmed Drmosh A1 Mogtaba B. Mekki PB Multidisciplinary Digital Publishing Institute YR 2021 K1 thin film semiconductors K1 titanium nitride K1 magnetron sputtering K1 X-ray photoelectron spectroscopy K1 atomic force microscopy JF Crystal Engineering LK http://dx.doi.org/https://doi.org/10.3390/cryst11030239 DO https://doi.org/10.3390/cryst11030239 SF ELIB - SuUB Bremen
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