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1 Ergebnisse
1
Electrical Properties and Thermal Annealing Effects of Poly..:
Doo-Seung Um
;
Mi-Jin Jin
;
Jong-Chang Woo
...
Crystal Engineering. , 2021
Link:
https://doi.org/10.3390/cryst11040351
RT Journal T1
Electrical Properties and Thermal Annealing Effects of Polycrystalline MoS2-MoSX Nanowalls Grown by Sputtering Deposition Method
UL https://suche.suub.uni-bremen.de/peid=base-ftmdpi:oai:mdpi.com:_2073-4352_11_4_351_&Exemplar=1&LAN=DE A1 Doo-Seung Um A1 Mi-Jin Jin A1 Jong-Chang Woo A1 Dong-Pyo Kim A1 Jungmin Park A1 Younghun Jo A1 Gwan-Ha Kim PB Multidisciplinary Digital Publishing Institute YR 2021 K1 MoS 2 K1 nanowall K1 crystal growth K1 sputter deposition K1 MoS 2 polycrystal characterization JF Crystal Engineering LK http://dx.doi.org/https://doi.org/10.3390/cryst11040351 DO https://doi.org/10.3390/cryst11040351 SF ELIB - SuUB Bremen
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