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Spectrophotometric Characterization of Thin Semi-Transparen..:
Steffen Wilbrandt
;
Olaf Stenzel
;
Abrar Liaf
...
Surface Characterization, Deposition and Modification. , 2022
Link:
https://doi.org/10.3390/coatings12091278
RT Journal T1
Spectrophotometric Characterization of Thin Semi-Transparent Aluminum Films Prepared by Electron Beam Evaporation and Magnetron Sputtering
UL https://suche.suub.uni-bremen.de/peid=base-ftmdpi:oai:mdpi.com:_2079-6412_12_9_1278_&Exemplar=1&LAN=DE A1 Steffen Wilbrandt A1 Olaf Stenzel A1 Abrar Liaf A1 Peter Munzert A1 Stefan Schwinde A1 Sven Stempfhuber A1 Nadja Felde A1 Marcus Trost A1 Tina Seifert A1 Sven Schröder PB Multidisciplinary Digital Publishing Institute YR 2022 K1 aluminum films K1 film thickness K1 layer deposition K1 optical constants K1 reflectance JF Surface Characterization, Deposition and Modification LK http://dx.doi.org/https://doi.org/10.3390/coatings12091278 DO https://doi.org/10.3390/coatings12091278 SF ELIB - SuUB Bremen
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