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1 Ergebnisse
1
A Fully Polarity-Aware Double-Node-Upset-Resilient Latch De..:
Jung-Jin Park
;
Young-Min Kang
;
Geon-Hak Kim
..
Microelectronics. , 2022
Link:
https://doi.org/10.3390/electronics11152465
RT Journal T1
A Fully Polarity-Aware Double-Node-Upset-Resilient Latch Design
UL https://suche.suub.uni-bremen.de/peid=base-ftmdpi:oai:mdpi.com:_2079-9292_11_15_2465_&Exemplar=1&LAN=DE A1 Jung-Jin Park A1 Young-Min Kang A1 Geon-Hak Kim A1 Ik-Joon Chang A1 Jinsang Kim PB Multidisciplinary Digital Publishing Institute YR 2022 K1 double-node upset (DNU) K1 radiation-hardened latch K1 radiation hardening by design (RHBD) K1 single event upset polarity K1 single-node upset (SNU) K1 soft error K1 static random-access memory (SRAM) JF Microelectronics LK http://dx.doi.org/https://doi.org/10.3390/electronics11152465 DO https://doi.org/10.3390/electronics11152465 SF ELIB - SuUB Bremen
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