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1 Ergebnisse
1
An Improved Structure Enabling Hole Erase Operation When Us..:
Seonjun Choi
;
Myounggon Kang
;
Yun-Heub Song
Semiconductor Devices. , 2023
Link:
https://doi.org/10.3390/electronics12132945
RT Journal T1
An Improved Structure Enabling Hole Erase Operation When Using an IGZO Channel in a 3D NAND Flash Structure to Which COP (Cell-On-Peri) Structure Is Applied
UL https://suche.suub.uni-bremen.de/peid=base-ftmdpi:oai:mdpi.com:_2079-9292_12_13_2945_&Exemplar=1&LAN=DE A1 Seonjun Choi A1 Myounggon Kang A1 Yun-Heub Song PB Multidisciplinary Digital Publishing Institute YR 2023 K1 3D NAND K1 polysilicon K1 IGZO K1 COP JF Semiconductor Devices LK http://dx.doi.org/https://doi.org/10.3390/electronics12132945 DO https://doi.org/10.3390/electronics12132945 SF ELIB - SuUB Bremen
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