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1 Ergebnisse
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Depth profile investigations of silicon nanocrystals formed..:
Yerci, Selçuk
;
Yıldız, İlker
;
KULAKCI, MUSTAFA
...
Yerci S., Yildiz I., KULAKCI M., SERİNCAN U., BAROZZİ M., BERSANİ M., Turan R., "Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation", JOURNAL OF APPLIED PHYSICS, cilt.102, 2007. , 2007
Link:
https://hdl.handle.net/11511/31026
RT Journal T1 <Title>Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftmetuankair:oai:https:__open.metu.edu.tr:11511_31026&Exemplar=1&LAN=DE A1 Yerci, Selçuk A1 Yıldız, İlker A1 KULAKCI, MUSTAFA A1 SERİNCAN, UĞUR A1 BAROZZİ, MARİO A1 BERSANİ, MASSİMO A1 Turan, Raşit PB JOURNAL OF APPLIED PHYSICS YR 2007 K1 Films K1 Matrix K1 Nanoparticles K1 XPS K1 Spectroscopic analysis K1 Si nanocrystals JF Yerci S., Yildiz I., KULAKCI M., SERİNCAN U., BAROZZİ M., BERSANİ M., Turan R., "Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation", JOURNAL OF APPLIED PHYSICS, cilt.102, 2007 LK http://dx.doi.org/https://hdl.handle.net/11511/31026 DO https://hdl.handle.net/11511/31026 SF ELIB - SuUB Bremen
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