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1 Ergebnisse
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Evolution of SiO2/Ge/HfO2(Ge) multilayer structure during h..:
Arslantunalı Şahin, Damla
;
Yıldız, İlker
;
Gencer, A. I
...
ARSLANTUNALI ŞAHİN D., YILDIZ İ., Gencer A. I. , AYGÜN ÖZYÜZER G., Slaoui A., TURAN R., "Evolution of SiO2/Ge/HfO2(Ge) multilayer structure during high temperature annealing", THIN SOLID FILMS, cilt.518, ss.2365-2369, 2010. , 2010
Link:
https://hdl.handle.net/11511/29988
RT Journal T1 <Title>Evolution of SiO2/Ge/HfO2(Ge) multilayer structure during high temperature annealing</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftmetuankair:oai:open.metu.edu.tr:11511_29988&Exemplar=1&LAN=DE A1 Arslantunalı Şahin, Damla A1 Yıldız, İlker A1 Gencer, A. I A1 AYGÜN ÖZYÜZER, GÜLNUR A1 Slaoui, A A1 Turan, Raşit PB THIN SOLID FILMS YR 2010 K1 Ge K1 Depth profiling K1 Raman spectroscopy K1 Segregation K1 HfO2 XPS JF ARSLANTUNALI ŞAHİN D., YILDIZ İ., Gencer A. I. , AYGÜN ÖZYÜZER G., Slaoui A., TURAN R., "Evolution of SiO2/Ge/HfO2(Ge) multilayer structure during high temperature annealing", THIN SOLID FILMS, cilt.518, ss.2365-2369, 2010 LK http://dx.doi.org/https://hdl.handle.net/11511/29988 DO https://hdl.handle.net/11511/29988 SF ELIB - SuUB Bremen
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