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1 Ergebnisse
1
Characterizing Developer Use of Automatically Generated Pat..:
Cambronero, Jose Pablo
;
Shen, Jiasi
;
Cito, Jurgen
..
10.1109/vlhcc.2019.8818884. , 2021
Link:
https://hdl.handle.net/1721.1/137541
RT Journal T1
Characterizing Developer Use of Automatically Generated Patches
UL https://suche.suub.uni-bremen.de/peid=base-ftmit:oai:dspace.mit.edu:1721.1_137541&Exemplar=1&LAN=DE A1 Cambronero, Jose Pablo A1 Shen, Jiasi A1 Cito, Jurgen A1 Glassman, Elena A1 Rinard, Martin PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 JF 10.1109/vlhcc.2019.8818884 LK http://dx.doi.org/https://hdl.handle.net/1721.1/137541 DO https://hdl.handle.net/1721.1/137541 SF ELIB - SuUB Bremen
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