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Characterization of interface states & radiation damage eff..:
Esebamen, Omeime Xerviar
Mid Sweden University doctoral thesis, 1652-893X. , 2014
Link:
http://urn.kb.se/resolve?urn=urn:nbn:se:miun:diva-2222
RT Journal T1
Characterization of interface states & radiation damage effects in duo-lateral PSDs : Using SEM microscopy and UV beam profiling techniques
UL https://suche.suub.uni-bremen.de/peid=base-ftmittuniv:oai:DiVA.org:miun-22221&Exemplar=1&LAN=DE A1 Esebamen, Omeime Xerviar PB Mittuniversitetet, Avdelningen för elektronikkonstruktion; Sundsvall : Mid Sweden University YR 2014 K1 Electrical Engineering K1 Electronic Engineering K1 Information Engineering K1 Elektroteknik och elektronik JF Mid Sweden University doctoral thesis, 1652-893X LK http://urn.kb.se/resolve?urn=urn:nbn:se:miun:diva-22221 DO http://urn.kb.se/resolve?urn=urn:nbn:se:miun:diva-22221 SF ELIB - SuUB Bremen
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