Lee, Ted Sian ; Ooi, Ean Hin ; Chang, Wei Sea.
Lee , T S , Ooi , E H , Chang , W S & Foo , J J 2021 , ' Fractal grid-induced turbulence strength characterization via piezoelectric thin-film flapping velocimetry ' , Scientific Reports , vol. 11 , no. 1 , 23322 . https://doi.org/10.1038/s41598-021-02680-7.  , 2021