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1 Ergebnisse
1
Towards more efficient security inspection via deep learnin..:
Nguyen, Hong Duc
;
Cai, Rizhao
;
Zhao, Heng
..
Micromachines. , 2022
Link:
https://hdl.handle.net/10356/160540
RT Journal T1
Towards more efficient security inspection via deep learning: a task-driven x-ray image cropping scheme
UL https://suche.suub.uni-bremen.de/peid=base-ftnanyangtu:oai:dr.ntu.edu.sg:10356_160540&Exemplar=1&LAN=DE A1 Nguyen, Hong Duc A1 Cai, Rizhao A1 Zhao, Heng A1 Kot, Alex Chichung A1 Wen, Bihan YR 2022 K1 Engineering::Electrical and electronic engineering K1 X-Ray Imaging K1 Objective Detection JF Micromachines LK http://dx.doi.org/https://hdl.handle.net/10356/160540 DO https://hdl.handle.net/10356/160540 SF ELIB - SuUB Bremen
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