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1 Ergebnisse
1
Graphene on SiC(0001) inspected by dynamic atomic force mic..:
Telychko, M
;
Berger, J
;
Majzik, Z
..
Telychko, M, Berger, J, Majzik, Z, Jelínek, P, Svec, M (2015). Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature. Beilstein Journal of Nanotechnology 6 (1) : 901-906. ScholarBank@NUS Repository. https://doi.org/10.3762/bjnano.6.93. , 2015
Link:
https://scholarbank.nus.edu.sg/handle/10635/183611
RT Journal T1 <Title>Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftnunivsingapore:oai:scholarbank.nus.edu.sg:10635_183611&Exemplar=1&LAN=DE A1 Telychko, M A1 Berger, J A1 Majzik, Z A1 Jelínek, P A1 Svec, M YR 2015 K1 Atomic force microscopy K1 Carbon K1 Electron scattering K1 Silicon carbide K1 AFM K1 Dynamic atomic force microscopy K1 Electronic contributions K1 Room temperature K1 SiC K1 STM K1 Theoretical simulation K1 Tunneling current K1 Graphene JF Telychko, M, Berger, J, Majzik, Z, Jelínek, P, Svec, M (2015). Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature. Beilstein Journal of Nanotechnology 6 (1) : 901-906. ScholarBank@NUS Repository. https://doi.org/10.3762/bjnano.6.93 LK http://dx.doi.org/https://scholarbank.nus.edu.sg/handle/10635/183611 DO https://scholarbank.nus.edu.sg/handle/10635/183611 SF ELIB - SuUB Bremen
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