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Material Characterization and Failure Analysis for Microele..:
Huang, Chien-Yi
https://openresearchlibrary.org/viewer/217cfcaf-ae5c-4abe-8bd2-1cad6d120978. , 2011
Link:
https://openresearchlibrary.org/viewer/217cfcaf-ae5c-4..
RT Journal T1 <Title>Material Characterization and Failure Analysis for Microelectronics Assembly Processes</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftopenresearchl:oai:biblioboard.com:217cfcaf-ae5c-4abe-8bd2-1cad6d120978&Exemplar=1&LAN=DE A1 Huang, Chien-Yi PB IntechOpen YR 2011 K1 Technology & Engineering / Quality Control K1 bisacsh:TEC032000 JF https://openresearchlibrary.org/viewer/217cfcaf-ae5c-4abe-8bd2-1cad6d120978 LK http://dx.doi.org/https://openresearchlibrary.org/viewer/217cfcaf-ae5c-4abe-8bd2-1cad6d120978 DO https://openresearchlibrary.org/viewer/217cfcaf-ae5c-4abe-8bd2-1cad6d120978 SF ELIB - SuUB Bremen
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