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1 Ergebnisse
1
Electromigration-induced resistance switching in indented A..:
Lombardo, Joseph
;
Collienne, Simon
;
Petrillo, Adrien
...
https://doi.org/10.1088/1367-2630/ab5025. , 2019
Link:
https://orbi.uliege.be/handle/2268/241594
RT Journal T1
Electromigration-induced resistance switching in indented Al microstrips ; Commutation de résistance induite par électromigration dans des microrubans en Al indentés
UL https://suche.suub.uni-bremen.de/peid=base-ftorbi:oai:orbi.ulg.ac.be:2268_241594&Exemplar=1&LAN=DE A1 Lombardo, Joseph A1 Collienne, Simon A1 Petrillo, Adrien A1 Fourneau, Emile A1 Nguyen, Ngoc Duy A1 Silhanek, Alejandro PB Institute of Physics Publishing YR 2019 K1 electromigration K1 memristor K1 nanofabrication K1 joule heating K1 current crowding K1 thin films K1 Physical K1 chemical K1 mathematical & earth Sciences K1 Physics K1 Physique K1 chimie K1 mathématiques & sciences de la terre JF https://doi.org/10.1088/1367-2630/ab5025 LK http://dx.doi.org/https://orbi.uliege.be/handle/2268/241594 DO https://orbi.uliege.be/handle/2268/241594 SF ELIB - SuUB Bremen
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