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Characterization of monolithic CMOS pixel sensor chip with ..:
Tambave, Ganesh Jagannath
;
Alme, Johan
;
Barnaföldi, Gergely Gábor
...
NFR/250858. , 2019
Link:
http://hdl.handle.net/10852/76474
RT Journal T1
Characterization of monolithic CMOS pixel sensor chip with ion beams for application in particle computed tomography
UL https://suche.suub.uni-bremen.de/peid=base-ftoslouniv:oai:www.duo.uio.no:10852_76474&Exemplar=1&LAN=DE A1 Tambave, Ganesh Jagannath A1 Alme, Johan A1 Barnaföldi, Gergely Gábor A1 Barthel, Rene A1 van den Brink, Anthony A1 Brons, Stephan A1 Chaar, Mamdouh A1 Eikeland, Viljar Nilsen A1 Genov, Georgi A1 Grøttvik, Ola Slettevoll A1 Pettersen, Helge Egil Seime A1 Pastuović̀, Željko A1 Huiberts, Simon A1 Helstrup, Håvard A1 Hetland, Kristin Fanebust A1 Mehendale, Shruti Vineet A1 Meric, Ilker A1 Malik, Qasim Waheed A1 Odland, Odd Harald A1 Papp, Gábor A1 Peitzmann, Thomas A1 Piersimoni, Pierluigi A1 Rehman, Attiq Ur A1 Reidt, Felix A1 Richter, Matthias A1 Røhrich, Dieter A1 Sudár, András A1 Samnøy, Andreas Tefre A1 Seco, Joao Carlos A1 Shafiee, Hesam A1 Skjæveland, Eivind Vågslid A1 Sølie, Jarle Rambo A1 Ullaland, Kjetil A1 Varga-Kofarago, Monika A1 Volz, Lennart A1 Wagner, Boris A1 Yang, Shiming PB North Holland Publishing Company YR 2019 JF NFR/250858 LK http://hdl.handle.net/10852/76474 DO http://hdl.handle.net/10852/76474 SF ELIB - SuUB Bremen
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