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W- and Mo-based polyoxometalates (POM) as interlayer in Al/..:
Yenel, Esma
;
Torlak, Yasemin
;
Koçyiğit, Adem
...
Journal of Materials Science: Materials in Electronics. , 2021
Link:
https://hdl.handle.net/11499/47379
RT Journal T1
W- and Mo-based polyoxometalates (POM) as interlayer in Al/n–Si photodiodes
UL https://suche.suub.uni-bremen.de/peid=base-ftpamukkaleuniv:oai:gcris.pau.edu.tr:11499_47379&Exemplar=1&LAN=DE A1 Yenel, Esma A1 Torlak, Yasemin A1 Koçyiğit, Adem A1 Erden, Ä°brahim A1 Kuş, Mahmut A1 Yıldırım, Murat PB Springer YR 2021 K1 Thermal evaporator K1 Silicon K1 Electric resistance K1 Molybdenum metallography K1 Ohmic contacts K1 Photodiodes K1 Polyoxometalates K1 Spectrometers K1 Detector parameters K1 Electrochemical behaviors K1 Rectifying behaviors K1 Rectifying properties K1 Series resistance values K1 Specific detectivity K1 Structural behaviors JF Journal of Materials Science: Materials in Electronics LK http://dx.doi.org/https://hdl.handle.net/11499/47379 DO https://hdl.handle.net/11499/47379 SF ELIB - SuUB Bremen
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