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Analysis of FPGA SEU sensitivity to combined effects of con..:
Juliano Benfica
;
GREEN, BRUNO
;
PORCHER, BRUNO C
...
2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), 2016, Brasil.. , 2016
Link:
http://hdl.handle.net/10923/12271
RT Journal T1 <Title>Analysis of FPGA SEU sensitivity to combined effects of conducted EMI and TID</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftpcunivgrande:oai:meriva.pucrs.br:10923_12271&Exemplar=1&LAN=DE A1 Juliano Benfica A1 GREEN, BRUNO A1 PORCHER, BRUNO C A1 Letícia Maria Bolzani Pöhls A1 Fabian Vargas A1 MEDINA, NILBERTO H A1 ADDED, NEMITALA A1 DE AGUIAR, VITOR A. P A1 MACCHIONE, EDUARDO L. A A1 AGUIRRE, FERNANDO A1 DA SILVEIRA, MARCILEI A. G YR 2016 JF 2016 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC), 2016, Brasil. LK http://hdl.handle.net/10923/12271 DO http://hdl.handle.net/10923/12271 SF ELIB - SuUB Bremen
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