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Test, Reliability and Functional Safety Trends for Automoti..:
F. Angione
;
D. Appello
;
J. Aribido
...
info:eu-repo/semantics/altIdentifier/isbn/978-1-6654-6706-3. , 2022
Link:
http://hdl.handle.net/11583/2971400
RT Journal T1 <Title>Test, Reliability and Functional Safety Trends for Automotive System-on-Chip</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftpoltorinoiris:oai:iris.polito.it:11583_2971400&Exemplar=1&LAN=DE A1 F. Angione A1 D. Appello A1 J. Aribido A1 J. Athavale A1 N. Bellarmino A1 P. Bernardi A1 R. Cantoro A1 C. De Sio A1 T. Foscale A1 G. Gavarini A1 J. Guerrero A1 M. Huch A1 G. Iaria A1 T. Kilian A1 R. Mariani A1 R. Martone A1 A. Ruospo A1 E. Sanchez A1 U. Schlichtmann A1 G. Squillero A1 M. Sonza Reorda A1 L. Sterpone A1 V. Tancorre A1 R. Ugioli PB IEEE YR 2022 JF info:eu-repo/semantics/altIdentifier/isbn/978-1-6654-6706-3 LK http://hdl.handle.net/11583/2971400 DO http://hdl.handle.net/11583/2971400 SF ELIB - SuUB Bremen
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