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1 Ergebnisse
1
Dimensional metrology at the nanoscale: quantitative charac..:
RIBOTTA, LUIGI
firstpage:1. , 2022
Link:
https://hdl.handle.net/11583/2972877
RT Journal T1
Dimensional metrology at the nanoscale: quantitative characterization of nanoparticles by means of metrological atomic force microscopy
UL https://suche.suub.uni-bremen.de/peid=base-ftpoltorinoiris:oai:iris.polito.it:11583_2972877&Exemplar=1&LAN=DE A1 RIBOTTA, LUIGI PB Politecnico di Torino; country:Italy YR 2022 K1 Dimensional Nanometrology K1 Atomic Force Microscopy (AFM) K1 Nanoparticles (NPs) K1 Tobacco Mosaic Viru K1 Tip-sample-substrate interaction K1 Tip Characterizer K1 Candidate Reference Material K1 Complex-shape K1 Critical Size K1 Morphological Parameter K1 Uncertainty Budget K1 Settore ING-IND/12 - Misure Meccaniche e Termiche JF firstpage:1 LK http://dx.doi.org/https://hdl.handle.net/11583/2972877 DO https://hdl.handle.net/11583/2972877 SF ELIB - SuUB Bremen
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