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1 Ergebnisse
1
Deep-trap dominated degradation of the endurance characteri..:
Yu, Tianpeng
;
Liu, Zhenliang
;
Wang, Yiru
...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10090149/. , 2023
Link:
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10090149/
RT Journal T1
Deep-trap dominated degradation of the endurance characteristics in OFET memory with polymer charge-trapping layer
UL https://suche.suub.uni-bremen.de/peid=base-ftpubmed:oai:pubmedcentral.nih.gov:10090149&Exemplar=1&LAN=DE A1 Yu, Tianpeng A1 Liu, Zhenliang A1 Wang, Yiru A1 Zhang, Lunqiang A1 Hou, Shuyi A1 Wan, Zuteng A1 Yin, Jiang A1 Gao, Xu A1 Wu, Lei A1 Xia, Yidong A1 Liu, Zhiguo PB Nature Publishing Group UK YR 2023 K1 Article JF http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10090149/ LK http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10090149/ DO http://www.ncbi.nlm.nih.gov/pmc/articles/PMC10090149/ SF ELIB - SuUB Bremen
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