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FTIR and electrical characterization of a-Si:H layers depos..:

ABDU ORDUÑA DIAZ ; CARLOS GERARDO TREVIÑO PALACIOS ; ALFONSO TORRES JACOME
citation:Orduña Diaz, A., et al., (2010). FTIR and electrical characterization of a-Si:H layers deposited by PECVD at different boron ratios, Materials Science and Engineering B. Vol. 174(1):93–96.  , 2010