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1 Ergebnisse
1
Two-dimensional thickness-dependent avalanche breakdown phe..:
이탁희
;
Pak, Jinsu
;
Jang, Yeonsik
...
ACS Nano, Vol.12 No.7, pp.7109-7116. , 2019
Link:
https://hdl.handle.net/10371/149846
RT Journal T1
Two-dimensional thickness-dependent avalanche breakdown phenomena in MoS2 field-effect transistors under high electric fields
UL https://suche.suub.uni-bremen.de/peid=base-ftseoulnuniv:oai:s-space.snu.ac.kr:10371_149846&Exemplar=1&LAN=DE A1 이탁희 A1 Pak, Jinsu A1 Jang, Yeonsik A1 Byun, Junghwan A1 Cho, Kyungjune A1 Kim, Tae-Young A1 Kim, Jae-Keun A1 Choi, Barbara Yuri A1 Shin, Jiwon A1 Hong, Yongtaek A1 Chung, Seungjun A1 Lee, Takhee PB American Chemical Society YR 2019 K1 BANDGAP SEMICONDUCTORS K1 IMPACT IONIZATION K1 MULTIPLICATION K1 ELECTRONICS K1 GRAPHENE K1 WIDE K1 BULK K1 MoS2 K1 avalanche multiplication K1 2D materials K1 field-effect transistors K1 electrical breakdown JF ACS Nano, Vol.12 No.7, pp.7109-7116 LK http://dx.doi.org/https://hdl.handle.net/10371/149846 DO https://hdl.handle.net/10371/149846 SF ELIB - SuUB Bremen
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