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1 Ergebnisse
1
STEM Image Analysis Based on Deep Learning: Identification ..:
Lee, Kihyun
;
Park, Jinsub
;
Choi, Soyeon
...
Nano Letters, Vol.22 No.12, pp.4677-4685. , 2022
Link:
https://hdl.handle.net/10371/184527
RT Journal T1 <Title>STEM Image Analysis Based on Deep Learning: Identification of Vacancy Defects and Polymorphs of MoS2</Title> UL https://suche.suub.uni-bremen.de/peid=base-ftseoulnuniv:oai:s-space.snu.ac.kr:10371_184527&Exemplar=1&LAN=DE A1 Lee, Kihyun A1 Park, Jinsub A1 Choi, Soyeon A1 Lee, Yangjin A1 Lee, Sol A1 Jung, Joowon A1 Lee, Jong-Young A1 Ullah, Farman A1 Tahir, Zeeshan A1 Kim, Yong Soo A1 Lee, Gwan-Hyoung A1 Kim, Kwanpyo PB American Chemical Society YR 2022 JF Nano Letters, Vol.22 No.12, pp.4677-4685 LK http://dx.doi.org/https://hdl.handle.net/10371/184527 DO https://hdl.handle.net/10371/184527 SF ELIB - SuUB Bremen
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