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1 Ergebnisse
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Comparative Study of the Low-Frequency-Noise Behaviors in a..:
Cho, In-Tak
;
Cheong, Woo-Seok
;
Hwang, Chi-Sun
...
IEEE Electron Device Letters, vol. 30, no. 8, pp. 828~830. , 2009
Link:
https://hdl.handle.net/10371/68017
RT Journal T1
Comparative Study of the Low-Frequency-Noise Behaviors in a-IGZO Thin-Film Transistors With Al2O3 and Al2O3/SiNx Gate Dielectrics
UL https://suche.suub.uni-bremen.de/peid=base-ftseoulnuniv:oai:s-space.snu.ac.kr:10371_68017&Exemplar=1&LAN=DE A1 Cho, In-Tak A1 Cheong, Woo-Seok A1 Hwang, Chi-Sun A1 Lee, Jeong-Min A1 Kwon, Hyuck-In A1 Lee, Jong-Ho PB Institute of Electrical and Electronics Engineers (IEEE) YR 2009 K1 a-IGZO K1 low-frequency noise JF IEEE Electron Device Letters, vol. 30, no. 8, pp. 828~830 LK http://dx.doi.org/https://hdl.handle.net/10371/68017 DO https://hdl.handle.net/10371/68017 SF ELIB - SuUB Bremen
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