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1 Ergebnisse
1
Deep Learning-Based High Throughput Inspection in 3D Nanofa..:
Utkarsh Anand (1343049)
;
Tanmay Ghosh (1681387)
;
Zainul Aabdin (1343043)
...
https://figshare.com/articles/media/Deep_Learning-Based_High_Throughput_Inspection_in_3D_Nanofabrication_and_Defect_Reversal_in_Nanopillar_Arrays_Implications_for_Next_Generation_Transistors/14188731. , 2021
Link:
https://doi.org/10.1021/acsanm.0c03283.s002
RT Journal T1
Deep Learning-Based High Throughput Inspection in 3D Nanofabrication and Defect Reversal in Nanopillar Arrays: Implications for Next Generation Transistors
UL https://suche.suub.uni-bremen.de/peid=base-ftsmithonian:oai:figshare.com:article_14188731&Exemplar=1&LAN=DE A1 Utkarsh Anand (1343049) A1 Tanmay Ghosh (1681387) A1 Zainul Aabdin (1343043) A1 Nandi Vrancken (1435555) A1 Hongwei Yan (1774468) A1 XiuMei Xu (1853821) A1 Frank Holsteyns (1853809) A1 Utkur Mirsaidov (1343040) YR 2021 K1 Biophysics K1 Cell Biology K1 Biotechnology K1 Space Science K1 Environmental Sciences not elsewhere classified K1 Biological Sciences not elsewhere classified K1 Physical Sciences not elsewhere classified K1 3 D Nanofabrication K1 HAR K1 surface SiO 2 layer K1 machine learning-based approach K1 Deep Learning-Based High Throughput K1 pattern collapse K1 Next Generation Transistors Densely K1 nanostructure K1 future microelectronics components K1 nanoscale semiconductor devices JF https://figshare.com/articles/media/Deep_Learning-Based_High_Throughput_Inspection_in_3D_Nanofabrication_and_Defect_Reversal_in_Nanopillar_Arrays_Implications_for_Next_Generation_Transistors/14188731 LK http://dx.doi.org/https://doi.org/10.1021/acsanm.0c03283.s002 DO https://doi.org/10.1021/acsanm.0c03283.s002 SF ELIB - SuUB Bremen
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