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Nanoscale Dopant Profiling of Individual Semiconductor Wire..:

Timothée Lassiaz (10534551) ; Pierre Tchoulfian (10534554) ; Fabrice Donatini (1511512)...
https://figshare.com/articles/journal_contribution/Nanoscale_Dopant_Profiling_of_Individual_Semiconductor_Wires_by_Capacitance_Voltage_Measurement/14381355. , 2021

Link: https://doi.org/10.1021/acs.nanolett.0c04491.s001

RT Journal
T1 <Title>Nanoscale Dopant Profiling of Individual Semiconductor Wires by Capacitance–Voltage Measurement</Title>

UL https://suche.suub.uni-bremen.de/peid=base-ftsmithonian:oai:figshare.com:article_14381355&Exemplar=1&LAN=DE
				
A1 Timothée Lassiaz (10534551)
A1 Pierre Tchoulfian (10534554)
A1 Fabrice Donatini (1511512)
A1 Julien Brochet (10534557)
A1 Romain Parize (1529527)
A1 Gwénolé Jacopin (1449994)
A1 Julien Pernot (1511506)
YR 2021
K1 Biophysics
K1 Biochemistry
K1 Medicine
K1 Cell Biology
K1 Genetics
K1 Biotechnology
K1 Immunology
K1 Developmental Biology
K1 Cancer
K1 Space Science
K1 Chemical Sciences not elsewhere classified
K1 Physical Sciences not elsewhere classified
K1 Information Systems not elsewhere classified
K1 Individual Semiconductor Wires
K1 epitaxial structures
K1 doping process
K1 doping conditions
K1 doping profile
K1 characterization techniques
K1 nanoscale
K1 core
K1 depletion region width
K1 Nanoscale Dopant Profiling
K1 epitaxial structure
K1 depletion width
K1 microwire
K1 electron profiles
K1 doping profile values
JF https://figshare.com/articles/journal_contribution/Nanoscale_Dopant_Profiling_of_Individual_Semiconductor_Wires_by_Capacitance_Voltage_Measurement/14381355
LK http://dx.doi.org/https://doi.org/10.1021/acs.nanolett.0c04491.s001
DO https://doi.org/10.1021/acs.nanolett.0c04491.s001
SF ELIB - SuUB Bremen

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