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Probing the Electron Beam-Induced Structural Evolution of H..:

Xian-Gang Zhou (10783328) ; Chen-Quan Yang (10783331) ; Xiahan Sang (2747026)...
https://figshare.com/articles/journal_contribution/Probing_the_Electron_Beam-Induced_Structural_Evolution_of_Halide_Perovskite_Thin_Films_by_Scanning_Transmission_Electron_Microscopy/14574773. , 2021

Link: https://doi.org/10.1021/acs.jpcc.1c02156.s001

RT Journal
T1 <Title>Probing the Electron Beam-Induced Structural Evolution of Halide Perovskite Thin Films by Scanning Transmission Electron Microscopy</Title>

UL https://suche.suub.uni-bremen.de/peid=base-ftsmithonian:oai:figshare.com:article_14574773&Exemplar=1&LAN=DE
				
A1 Xian-Gang Zhou (10783328)
A1 Chen-Quan Yang (10783331)
A1 Xiahan Sang (2747026)
A1 Wei Li (7081)
A1 Li Wang (15202)
A1 Zhi-Wen Yin (10783334)
A1 Jing-Ru Han (10783337)
A1 Yu Li (183836)
A1 Xiaoxing Ke (1501597)
A1 Zhi-Yi Hu (292639)
A1 Yi-Bing Cheng (1353861)
A1 Gustaaf Van Tendeloo (8667948)
YR 2021
K1 Biophysics
K1 Biochemistry
K1 Medicine
K1 Microbiology
K1 Pharmacology
K1 Biotechnology
K1 Evolutionary Biology
K1 Cancer
K1 Infectious Diseases
K1 Space Science
K1 Chemical Sciences not elsewhere classified
K1 Physical Sciences not elsewhere classified
K1 Information Systems not elsewhere classified
K1 framework forms
K1 dose rate
K1 γ- CsPbIBr 2 perovskite
K1 energy-dispersive X-ray spectroscopy
K1 results show
K1 electron beam dose
K1 electron beam irradiation artifacts
K1 large-range electron dose measurement
K1 Halide Perovskite
K1 electron beam
K1 STEM mode
K1 electron dose increases
K1 Electron Beam-Induced Structural Ev
K1 Cs 2 IBr phase
K1 atomic-resolution imaging
K1 Pb nanoparticles
K1 Scanning Transmission Electron Micr
K1 γ- CsPbIBr 2
K1 electron beam irradiation
K1 electron beam-induced
K1 CsPbIBr 2
K1 unit cell
K1 γ- CsPbIBr 2 phase
K1 single-electron events
K1 Pb 0
K1 halide perovskite materials
JF https://figshare.com/articles/journal_contribution/Probing_the_Electron_Beam-Induced_Structural_Evolution_of_Halide_Perovskite_Thin_Films_by_Scanning_Transmission_Electron_Microscopy/14574773
LK http://dx.doi.org/https://doi.org/10.1021/acs.jpcc.1c02156.s001
DO https://doi.org/10.1021/acs.jpcc.1c02156.s001
SF ELIB - SuUB Bremen

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