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Defect Chemistry of Individual Grains with and without Grai..:

Julian Zahnow (10023472) ; Michele Bastianello (10653016) ; Jürgen Janek (1272231).
https://figshare.com/articles/journal_contribution/Defect_Chemistry_of_Individual_Grains_with_and_without_Grain_Boundaries_of_Al-Doped_Ceria_Determined_Using_Well-Defined_Microelectrodes/19071520. , 2022

Link: https://doi.org/10.1021/acs.jpcc.1c07942.s001

RT Journal
T1 <Title>Defect Chemistry of Individual Grains with and without Grain Boundaries of Al-Doped Ceria Determined Using Well-Defined Microelectrodes</Title>

UL https://suche.suub.uni-bremen.de/peid=base-ftsmithonian:oai:figshare.com:article_19071520&Exemplar=1&LAN=DE
				
A1 Julian Zahnow (10023472)
A1 Michele Bastianello (10653016)
A1 Jürgen Janek (1272231)
A1 Matthias T. Elm (1466332)
YR 2022
K1 Biophysics
K1 Biochemistry
K1 Cell Biology
K1 Genetics
K1 Evolutionary Biology
K1 Sociology
K1 Developmental Biology
K1 Hematology
K1 Plant Biology
K1 Space Science
K1 Chemical Sciences not elsewhere classified
K1 Physical Sciences not elsewhere classified
K1 locally resolved measurements
K1 1500 ° c
K1 electrochemical transport processes
K1 single grains increases
K1 defined microelectrodes onto
K1 grain interior contributions
K1 contact individual grains
K1 without grain boundaries
K1 defined microelectrodes
K1 grain interior
K1 grain boundaries
K1 individual grains
K1 transport characteristics
K1 grain boundary
K1 temperature range
K1 specific material
K1 results demonstrate
K1 powerful tool
K1 polycrystalline material
K1 microelectrode approach
K1 microcrystalline samples
K1 equilibrium constants
K1 direct characterization
K1 differs due
K1 defect chemistry
K1 beam lithography
K1 analyzed quantitatively
K1 activation energy
K1 93 ev
K1 8 h
K1 773 k
JF https://figshare.com/articles/journal_contribution/Defect_Chemistry_of_Individual_Grains_with_and_without_Grain_Boundaries_of_Al-Doped_Ceria_Determined_Using_Well-Defined_Microelectrodes/19071520
LK http://dx.doi.org/https://doi.org/10.1021/acs.jpcc.1c07942.s001
DO https://doi.org/10.1021/acs.jpcc.1c07942.s001
SF ELIB - SuUB Bremen

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