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1 Ergebnisse
1
Perspective of buried oxide thickness variation on triple m..:
Priya, Anjali
;
Srivastava, Nilesh Anand
;
Mishra, Ram Awadh
Advances in electrical and electronic engineering. , 2018
Link:
http://hdl.handle.net/10084/132829
RT Journal T1
Perspective of buried oxide thickness variation on triple metal-gate (TMG) recessed-S/D FD-SOI MOSFET
UL https://suche.suub.uni-bremen.de/peid=base-fttuostrava:oai:dspace.vsb.cz:10084_132829&Exemplar=1&LAN=DE A1 Priya, Anjali A1 Srivastava, Nilesh Anand A1 Mishra, Ram Awadh PB Vysoká škola báňská - Technická univerzita Ostrava YR 2018 K1 buried oxide K1 FD-SOI K1 Re-S/D K1 short channel effects JF Advances in electrical and electronic engineering LK http://hdl.handle.net/10084/132829 DO http://hdl.handle.net/10084/132829 SF ELIB - SuUB Bremen
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